http://publications.oasisinternationaljournal.org/index.php/ijnrste <div class="row gridblock" style="padding-top: 0px;"> <div class="col-md-12 text-center col-xs-12 col-sm-12 text-center"> <p class="">IJNRSTE aims to cover the latest outstanding development in the fields of Science, Technology and Engineering. As an open access E-Journal, IJNRSTE provides free access to all published articles for the authors, the research community and other interested groups all over the world. This offers a means of generating and disseminating research based information that will enhance global advancement in all aspect of science, technology and engineering.</p> </div> </div> en-US ijnrste@oasisinternationaljournal.org (Dr Nweke-Okaa P.C.) technicalsupport@oasisinternationaljournal.org (Judebill) Tue, 10 Dec 2024 00:00:00 +0000 OJS 3.3.0.8 http://blogs.law.harvard.edu/tech/rss 60 http://publications.oasisinternationaljournal.org/index.php/ijnrste/article/view/78 <p>The optical characteristics of Nickel Oxide (NiO) thin films deposited on glass substrates via chemical bath deposition at room temperature were systematically investigated. The absorbance spectra of the films were recorded using shimadzu UV – 2030 UV-Vis spectrophotometer with high sensitivity photomultiplier tube (PMT) detector, spanning wavelength range of 300 – 1100 nm. The results showed that the films exhibited high transparency with an average transmittance of approximately 80%. The optical absorption study revealed that NiO thin film has a bandgap range of 3.5 eV- 3.8 eV and a refractive index of 1.5. Notably the reflectance of the deposited films was observed to be low across the entire measured spectrum.</p> Morka, J.C., Okafor C., Okafor, M. C. Copyright (c) 2024 International Journal of Novel Research in Science, Technology and Engineering https://creativecommons.org/licenses/by-nc-sa/4.0 http://publications.oasisinternationaljournal.org/index.php/ijnrste/article/view/78 Tue, 10 Dec 2024 00:00:00 +0000